M-Ray Technology

"Our technology is accurate"

... and clean

The origin

Contactless M-Ray technology has been developed to measure thickness, basis-weight and anomalies of flat non-metallic structures including non-wovens, textiles, plastic films & sheets, synthetic foams, etc.

The revolutionary M-Rays measuring technology is based on 8 years of research in the KU Leuven university (ESAT - MICAS research group), conducted by general manager Noël Deferm and technical & product manager Tom Redant. Noël specialised in the high-frequency technology itself. Tom developed methods to retrieve useful dimensional information from the environment.

Noël and Tom discovered that the electromagnetic waves slow down when penetrating materials such as paper and plastic. The longer their travel time the thicker or heavier the material. Through accurate time measurements, they succeeded in accurately measuring the thickness or the basis-weight of a range of materials.

Multi-disciplinary engineering excellence enabled Noël and Tom to realise economically-viable precision and robustness levels for their M-Ray millimeter wave technology. The M-Rays enable high-standoff measurements, avoiding scratches and defects on the material.

The principles

Contactless M-Ray technology has been developed to measure thickness, basis-weight and anomalies of flat non-metallic structures including non-wovens, textiles, plastic films & sheets, synthetic foams, etc.

The revolutionary M-Rays measuring technology is based on 8 years of research in the KU Leuven university (ESAT - MICAS research group), conducted by general manager Noël Deferm and technical & product manager Tom Redant. Noël specialised in the high-frequency technology itself. Tom developed methods to retrieve useful dimensional information from the environment.

Noël and Tom discovered that the electromagnetic waves slow down when penetrating materials such as paper and plastic. The longer their travel time the thicker or heavier the material. Through accurate time measurements, they succeeded in accurately measuring the thickness or the basis-weight of a range of materials.

Multi-disciplinary engineering excellence enabled Noël and Tom to realise economically-viable precision and robustness levels for their M-Ray millimeter wave technology. The M-Rays enable high-standoff measurements, avoiding scratches and defects on the material.

 

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Contactless M-Ray technology has been developed to measure thickness, basis-weight and anomalies of flat non-metallic structures including non-wovens, textiles, plastic films & sheets, synthetic foams, etc.

The revolutionary M-Rays measuring technology is based on 8 years of research in the KU Leuven university (ESAT - MICAS research group), conducted by general manager Noël Deferm and technical & product manager Tom Redant. Noël specialised in the high-frequency technology itself. Tom developed methods to retrieve useful dimensional information from the environment.

Noël and Tom discovered that the electromagnetic waves slow down when penetrating materials such as paper and plastic. The longer their travel time the thicker or heavier the material. Through accurate time measurements, they succeeded in accurately measuring the thickness or the basis-weight of a range of materials.

Multi-disciplinary engineering excellence enabled Noël and Tom to realise economically-viable precision and robustness levels for their M-Ray millimeter wave technology. The M-Rays enable high-standoff measurements, avoiding scratches and defects on the material.

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