Technologie

Sensortechnologie

Voor metingen van basisgewicht, dikte en vochtigheid.

https://www.hammer-ims.com/technology/m-ray-technology-based-on-electromagnetic-millimeter-waves

M-Ray

Elektromagnetische millimetergolftechnologie

U-Ray

Ultrasone sensortechnologie

L-Ray

Laser sensortechnologie

C-Ray

Capacitieve sensortechnologie

Cameratechnologie

Voor oppervlakte-inspectie.

Anomaly detection & classification

AI-powered surface inspection technology

Infrared image technology

For content inspection, material sorting, part inspection, plastic recycling and more

Thermal (FLIR) Imaging Technology

For fault detection, quality assurance, safety and energy management

Dimensional measurements

AI-powered surface inspection technology

Add-ons

Connectivity 3.0

Control software technology for all systems

Ex/ATEX

Ex/ATEX compliant systems

Seamless process integration

Advanced monitoring and data feedback

Multi-head measuring

Measurements with near 100% material coverage

Revolutioneer uw kwaliteitscontrole

Wij leiden de industrie in innovatieve meetoplossingen.